Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
This tester is intended to quickly check whether a transistor is functional or not and possibly also select two or more transistors with (approximately) equal gains. This is about the simplest ...
Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.
For almost two decades, scientists have been trying to move beyond silicon, the material ...
Why might you need semiconductor system-level test (SLT)? As Karthik Ranganathan, director for semiconductor solutions at Astronics Test Systems, points out, if you test a 22-nm, ...
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