Electronic Design

Principles of Analog In-Circuit Testing

In-circuit test (ICT) has been instrumental in identifying manufacturing process defects and component defects on countless varieties of populated printed circuit board (PCB) assemblies for more than ...
EDN

The basics of testing op amps, part 2:

Figure 1. Use the circuit in (a) to measure input bias current on the op amp’s noninverting input. Adding a loop amplifier in (b) keeps the op-amp stable for measurements on the inverting input. The ...
Electronic Design

Flying Probe Testing: The Fixtureless In-Circuit Test that Must be Fixed

Change in life is inevitable. You know this, yet sometimes you just choose not to accept it. You just close your eyes and think the world has also stopped. But even you realize that’s not the case. It ...
EDN

The basics of testing op amps, part 4:

Download an Excel spreadsheet for calculating C COMP. In previous installments, we covered some of the basic tests and identified the sources of errors that occur when designing and testing ...