Electronic Design

What’s Next for Physically Aware DFT?

Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
EDN

Take scan test out of the critical path

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
Semiconductor Engineering

Building Bridges: A New DFT Paradigm

Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Semiconductor Engineering

Power-Aware Test: Addressing Power Challenges In DFT And Test

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...